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3 March 2020 Characterization of HOT MWIR InAs/InAsSb T2SL discrete photodetectors
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Proceedings Volume 11276, Optical Components and Materials XVII; 112760J (2020) https://doi.org/10.1117/12.2553686
Event: SPIE OPTO, 2020, San Francisco, California, United States
Abstract
A comprehensive study of mid-wavelength infrared (MWIR) InAs/InAsSb type-II superlattice (T2SL) photodetectors was performed for full characterization of the E-O performance, reliability, and linearity as well as response speed. Teledyne Judson Technologies has recently developed high operating temperature (HOT) MWIR InAs/InAsSb T2SL large area discrete detectors of 0.25mm and 1mm for front-side illumination. The 50% cut-off wavelength of the detectors ranges from ~5.4 to ~5.7μm at room temperature. For the reliability tests, the T2SL detectors were thermally cycled and humidity tested. Initial testing data showed excellent stability to the temperature and humidity, indicating the T2SL detectors have long-term stability. Linearity, response speed and capacitance were measured at various temperatures and reverse biases. This work presents comprehensive test results, data analysis, and discussion, showing these large size, discrete T2SL detectors have the potential to replace conventional MWIR detector materials.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jongwoo Kim, Henry Yuan, Andrey Rumyantsev, Phillip Bey, David Bond, Joe Kimchi, and Mary Grace DeForest "Characterization of HOT MWIR InAs/InAsSb T2SL discrete photodetectors", Proc. SPIE 11276, Optical Components and Materials XVII, 112760J (3 March 2020); https://doi.org/10.1117/12.2553686
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