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10 March 2020 Ultrafast optical pulse from non-paraxial beam-shaping to optical metrology (Conference Presentation)
Simon Thibault, Charles Pichette, Pierre Marquet, Michel Piché
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Proceedings Volume 11278, Ultrafast Phenomena and Nanophotonics XXIV; 1127819 (2020) https://doi.org/10.1117/12.2542108
Event: SPIE OPTO, 2020, San Francisco, California, United States
Abstract
Ultrashort pulse light beam is an important tool in many areas of science and technology. It is used to study ultrafast phenomena to new imaging modalities. Because of its ultra-broad frequency bandwidth, it can be used to control, manipulate, and characterize light–matter interactions. Over the recent years, we have played with non-paraxial beams and short pulses new imaging modalities. However, we also found the ultrashort optical pulse of a fraction or few optical cycles may change many well-known assumptions in optical metrology. Here a few questions: • How the ultrashort pulse affects the diffraction point spread function? • Does ultrashort pulse interferometry to test optical component is possible? • How the far field and near field diffraction are affected by ultrashort pulse duration? • How vectorial beams are affected under short pulse and non-paraxial conditions? In this talk, we will try to introduce how ultrashort pulse may open a new area in optical metrology.
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Simon Thibault, Charles Pichette, Pierre Marquet, and Michel Piché "Ultrafast optical pulse from non-paraxial beam-shaping to optical metrology (Conference Presentation)", Proc. SPIE 11278, Ultrafast Phenomena and Nanophotonics XXIV, 1127819 (10 March 2020); https://doi.org/10.1117/12.2542108
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KEYWORDS
Ultrafast phenomena
Near field optics
Optical metrology
Beam shaping
Ultrafast measurement systems
Femtosecond phenomena
Laser applications
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