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18 February 2020 Layer-dependent third-harmonic generation in multi-layer SnSe2
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Proceedings Volume 11282, 2D Photonic Materials and Devices III; 112820R (2020)
Event: SPIE OPTO, 2020, San Francisco, California, United States
We report spatially resolved measurement of third-harmonic generation (THG) emission from a Tin diselenide (SnSe2) multi-layer flake at a fundamental excitation wavelength of 1550 nm using a nonlinear optical microscopy system and study its thickness dependence. We also estimate the magnitude of the real part of the electronic nonlinearity susceptibility (χ(3) coefficient) by analyzing the thickness-dependence and found to be approximately 1.6×10-19 m2/V2, which is around 1500 times higher than that of the glass when measured with the same settings. We find excellent agreement between the measured THG thickness dependence and the analytical model considering absorption of harmonic emission in SnSe2 medium, phase mismatch and the multipath interference due to the underlying oxide/Si substrate. We also measure the second harmonic generation from same flake and find this to be maximum for thickness in the range of 10-12nm.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rabindra Biswas, Medha Dandu, Keshav Kumar Jha, Sruti Menon, Jyothsna K. M., Kaushik Majumdar, and Varun Raghunathan "Layer-dependent third-harmonic generation in multi-layer SnSe2", Proc. SPIE 11282, 2D Photonic Materials and Devices III, 112820R (18 February 2020);

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