A wavelength reference at 1560 nm using a photonic rubidium spectrometer and aluminum nitride microresonator frequency doubler (Conference Presentation)

Casey McKenna; Douglas G. Bopp; Zachary L. Newman; Joshua B. Surya; Alexander Yulaev; Daron Westly; Kartik Srinivasan; Vladimir Aksyuk; Hong X. Tang; John E. Kitching; Matthew T. Hummon

doi:10.1117/12.2546429

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9 March 2020 A wavelength reference at 1560 nm using a photonic rubidium spectrometer and aluminum nitride microresonator frequency doubler (Conference Presentation)

Casey McKenna, Douglas G. Bopp, Zachary L. Newman, Joshua B. Surya, Alexander Yulaev, Daron Westly, Kartik Srinivasan, Vladimir Aksyuk, Hong X. Tang, John E. Kitching, Matthew T. Hummon

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Proceedings Volume 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II; 112963E (2020) https://doi.org/10.1117/12.2546429
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

Wavelength references in the telecom spectrum have applications in communications and dimensional metrology. However, they typically consist of bulk optics and vapor cells. Photonic integration of these components may lead to low cost, portable devices. Here we demonstrate the incorporation of a photonic Rb spectrometer with an AlN microresonator frequency doubler. Light at 1560 nm is coupled onto a chip containing the AlN microresonator frequency doubler. The resulting 780 nm light is sent to the photonic Rb spectrometer, which consists of an apodized grating beam expander and microfabricated MEMS vapor cell. We perform Doppler broadened spectroscopy of the D2 line and demonstrate preliminary laser stabilization to these features.

Conference Presentation

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Casey McKenna, Douglas G. Bopp, Zachary L. Newman, Joshua B. Surya, Alexander Yulaev, Daron Westly, Kartik Srinivasan, Vladimir Aksyuk, Hong X. Tang, John E. Kitching, and Matthew T. Hummon "A wavelength reference at 1560 nm using a photonic rubidium spectrometer and aluminum nitride microresonator frequency doubler (Conference Presentation)", Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112963E (9 March 2020); https://doi.org/10.1117/12.2546429

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