Variable strength measurements of non-local observables

Noah Lupu-Gladstein; Hugo Ferretti; Weng-Kian Tham; Ou Teen Arthur Pang; Aephraim M. Steinberg; Kent Bonsma-Fisher; Aharon Brodutch

doi:10.1117/12.2552541

25 February 2020 Variable strength measurements of non-local observables

Noah Lupu-Gladstein, Hugo Ferretti, Weng-Kian Tham, Ou Teen Arthur Pang, Aephraim M. Steinberg, Kent Bonsma-Fisher, Aharon Brodutch

Author Affiliations +

Proceedings Volume 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II; 1129646 (2020) https://doi.org/10.1117/12.2552541
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

Quantum non-demolition measurements play an important role in quantum theory and many of its applications. In theory they are the most fundamental quantum measurements, but in practice their realization can be chal- lenging due to realistic constraints. In optics for example, most measurements are destructive since photons get absorbed by the detector. While some simple single particle non-demolition measurements are routinely done in optical setups by using a second degree of freedom to encode the results at an intermediate stage, measurements of degenerate non-local observables involving multiple photons remain challenging, especially when these are done at intermediate measurement strengths. Here we present an optical setup for performing variable strength non-demolition measurements of non-local observables in a pre and postselected setting. At the heart of the setup is an apparatus that can be used to turn a strong (projective) measurement into an arbitrary strength measurement by using a quantum eraser. We present our initial calibration results for this apparatus.

Conference Presentation

Citation Download Citation

Noah Lupu-Gladstein, Hugo Ferretti, Weng-Kian Tham, Ou Teen Arthur Pang, Aephraim M. Steinberg, Kent Bonsma-Fisher, and Aharon Brodutch "Variable strength measurements of non-local observables", Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129646 (25 February 2020); https://doi.org/10.1117/12.2552541

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