Quality control optical characterization of NIR VCSEL based light sources for 3D imaging applications

Pierre Boher; Thierry Leroux; Véronique Collomb-Patton

doi:10.1117/12.2543520

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24 February 2020 Quality control optical characterization of NIR VCSEL based light sources for 3D imaging applications

Pierre Boher, Thierry Leroux, Véronique Collomb-Patton

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Proceedings Volume 11300, Vertical-Cavity Surface-Emitting Lasers XXIV; 1130006 (2020) https://doi.org/10.1117/12.2543520
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

Low cost and compact 3D imaging for various applications like face-recognition, machine vision or LIDAR for automotive has introduced new requirements in terms of NIR light source characterization. These sources must comply safety regulations and must be verified rapidly and accurately during the fabrication process. In addition, precise characterization of the light source emissions within their entire angular aperture is mandatory to get accurate 3D images. The paper introduces a new Fourier optics system dedicated to this task.

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Pierre Boher, Thierry Leroux, and Véronique Collomb-Patton "Quality control optical characterization of NIR VCSEL based light sources for 3D imaging applications", Proc. SPIE 11300, Vertical-Cavity Surface-Emitting Lasers XXIV, 1130006 (24 February 2020); https://doi.org/10.1117/12.2543520

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