Paper
6 October 1989 High Sensitivity, High Data Rate Receivers For ISL Using Low-Noise Silicon APD's
Andrew D. MacGregor, Bruno Dion, Robert J. McIntyre
Author Affiliations +
Proceedings Volume 1131, Optical Space Communication; (1989) https://doi.org/10.1117/12.961545
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France
Abstract
Silicon APD's (Avalanche Photodiodes) with very low excess noise factors have been developed at RCA. At 830 nm and an average gain of 150, an excess noise factor of 2.6 should be possible in a 100 μm active diameter detector, with a quantum efficiency of 90% and a capacitance of 0.25 pF. When combined with a low-noise preamplifier, it is predicted that direct-detection optical receivers can be constructed with a sensitivity which is within 3 to 4 dB of that achievable with an "ideal" optical receiver.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew D. MacGregor, Bruno Dion, and Robert J. McIntyre "High Sensitivity, High Data Rate Receivers For ISL Using Low-Noise Silicon APD's", Proc. SPIE 1131, Optical Space Communication, (6 October 1989); https://doi.org/10.1117/12.961545
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Cited by 4 scholarly publications.
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KEYWORDS
Avalanche photodetectors

Receivers

Sensors

Capacitance

Field effect transistors

Signal to noise ratio

Signal attenuation

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