Artifact correction for small metals by combining pattern matching and interpolation methods in x-ray

Keisuke Yamakawa; Keiko Takahashi; Tadashi Nakamura

doi:10.1117/12.2548965

16 March 2020 Artifact correction for small metals by combining pattern matching and interpolation methods in x-ray

Keisuke Yamakawa, Keiko Takahashi, Tadashi Nakamura

Author Affiliations +

Proceedings Volume 11312, Medical Imaging 2020: Physics of Medical Imaging; 113122C (2020) https://doi.org/10.1117/12.2548965
Event: SPIE Medical Imaging, 2020, Houston, Texas, United States

Abstract

To suppress artifacts in X-ray digital tomosynthesis, a method which combines 3D and 2D region growing was proposed. However, it could not extract small metals such as pins, due to the discontinuity of the metal in the 3D projection data. A novel method is proposed to separate the metal from the projection data by combining pattern matching between neighboring projection angles and interpolating image pixels of enlarged projection data for each projection angle. The proposed method was compared with the conventional method based on 3D region growing. In a phantom experiment, the proposed method reduced the artifacts close to the metals. At a distance within 1 mm from the metal object, the mean absolute error evaluated without metal artifact correction (No MAC), with the conventional and proposed methods were 461.2, 461.2, and 100.2, respectively, and an improvement of more than 78% was demonstrated. When the distance from the object was shorter, the artifact became more significant in the No MAC and conventional methods, so the effectiveness of the proposed method was higher. Applying a suitable artifact correction on the basis of metal extraction makes it possible to effectively reduce artifacts in DT images.

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Keisuke Yamakawa, Keiko Takahashi, and Tadashi Nakamura "Artifact correction for small metals by combining pattern matching and interpolation methods in x-ray", Proc. SPIE 11312, Medical Imaging 2020: Physics of Medical Imaging, 113122C (16 March 2020); https://doi.org/10.1117/12.2548965

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