Presentation + Paper
23 March 2020 Illumination control in lensless imaging for EUV mask inspection and review
Author Affiliations +
Abstract
Coherence control and flexible pupil fill play a key role in the imaging of EUV reticles. This is also true for lensless metrology applications based on coherent diffraction imaging. We describe the concept and the key components of a Fourier synthesis illuminator designed to provide the RESCAN microscope with flexible illumination capabilities and to improve its resolution limit. In particular, we discuss the characteristics of the three mirrors of the new illuminator and the requirements for their multilayer coating.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Iacopo Mochi, Hyun-Su Kim, Uldis Locans, Atoosa Dejkameh, Ricarda Nebling, Dimitrios Kazazis, and Yasin Ekinici "Illumination control in lensless imaging for EUV mask inspection and review", Proc. SPIE 11323, Extreme Ultraviolet (EUV) Lithography XI, 113231I (23 March 2020); https://doi.org/10.1117/12.2552014
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KEYWORDS
Extreme ultraviolet

Photomasks

Microscopes

Inspection

Reflectivity

Imaging systems

Sensors

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