One-shot optical sectioning structured illumination microscopy

Hongting Wang; Wenli Liu; Zhixiong Hu; Xiuyu Li; Baoyu Hong

doi:10.1117/12.2541477

18 December 2019 One-shot optical sectioning structured illumination microscopy

Hongting Wang, Wenli Liu, Zhixiong Hu, Xiuyu Li, Baoyu Hong

Proceedings Volume 11338, AOPC 2019: Optical Sensing and Imaging Technology; 113380F (2019) https://doi.org/10.1117/12.2541477
Event: Applied Optics and Photonics China (AOPC2019), 2019, Beijing, China

Abstract

We propose fast, economical one-shot optical sectioning structured illumination microscopy (OSSIM) based on the sectioning structured illumination wide-field fluorescence microscopy (SSIWM). Unlike using three precise known phase patterns in conventional three-step SSIWM, every section of the specimen is modulated using a one-dimensional sinusoidal pattern with an arbitrary phase in the proposed method. There are few steps to get the section image from the modulated image. A fringe-free spectrum is obtained using a filter in the Fourier domain, and the reconstructed section is recovered from its inverse Fourier transform and the modulus calculation. In the conventional SSIWM, the accurate positioning is demanded to match the three phases perfectly to avoid artificial fringe on the reconstructed image. Compared with three-step SSIWM, OSSIM shows reduced illumination and observation time, specimen damage, and it avoids reconstruction artefacts resulting from inaccurate phase-shift. Furthermore, OSSIM can directly utilize images captured using SSIWM without modifying the setup. The proposed method is supported by a series of derivations and is validated through simulations and experiments.

Citation Download Citation

Hongting Wang, Wenli Liu, Zhixiong Hu, Xiuyu Li, and Baoyu Hong "One-shot optical sectioning structured illumination microscopy", Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 113380F (18 December 2019); https://doi.org/10.1117/12.2541477

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