Presentation + Paper
13 October 2020 Can phase masks extend depth-of-field in localization microscopy?
Author Affiliations +
Abstract
In localization microscopy, the position of isolated fluorescent emitters are estimated with a resolution better than the diffraction limit. In order to image thick samples, which are common in biological applications, there is considerable interest in extending the depth-of-field of such microscopes in order to make their accuracy as invariant as possible to defocus. For that purpose, we propose to optimize annular binary phase masks placed in the pupil of the microscope in order to generate a point spread function for which the localization accuracy is almost invariant along the optical axis. The optimization criterion is defined as the localization accuracy in the plane expressed in terms of the Cram´er-Rao bound. We show that the optimal masks significantly increase the depth-of-field of single-molecule imaging techniques relatively to an usual microscope objective.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Olivier Lévêque, Caroline Kulcsár, Hervé Sauer, Antony Lee, Pierre Bon, Laurent Cognet, and François Goudail "Can phase masks extend depth-of-field in localization microscopy?", Proc. SPIE 11351, Unconventional Optical Imaging II, 113510E (13 October 2020); https://doi.org/10.1117/12.2558426
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KEYWORDS
Image quality

Microscopy

Deconvolution

Luminescence

Microscopes

Biology

Image acquisition

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