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30 March 2020 Fourier ptychographic microscopy and Mueller matrix microscopy: differences and complementarity
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Abstract
When a light wave passes through a sample, it undergoes a phase delay related to the optical path it has taken. The amount of shift is proportional to the product of the refractive index and the thickness of the sample and cannot be measured using conventional light microscopy. Furthermore, the velocity of light propagation in an optically anisotropic medium may depend on its polarization state. This causes a phase shift between the polarization components of the oscillating electric field called retardance. Both quantitative phase and polarimetric retardance are commonly used to examine biological tissues. This work investigates the complementarity of information retrieved by two optical modalities: Fourier Ptychographic Microscopy and Mueller Matrix Microscopy. We present two constructed microscopes and then compare the results obtained using histological slides for experimental validation.
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© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anastasia Bozhok, Jean Dellinger, Yoshitate Takakura, Jihad Zallat, and Christian Heinrich "Fourier ptychographic microscopy and Mueller matrix microscopy: differences and complementarity", Proc. SPIE 11351, Unconventional Optical Imaging II, 1135122 (30 March 2020); https://doi.org/10.1117/12.2550964
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