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1 April 2020 UV absorption mapping as subsurface damage inspection in transparent optical materials
H. Cattaneo, R. Botha, C. Ziolek
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Proceedings Volume 11352, Optics and Photonics for Advanced Dimensional Metrology; 1135205 (2020) https://doi.org/10.1117/12.2555715
Event: SPIE Photonics Europe, 2020, Online Only
Abstract
Local alterations in UV absorption have been used to investigate subsurface damage in transparent optical materials. As a detection method, a collinear pump-probe arrangement has been utilized and absorption-induced deflections in the nonresonant probe beam has been detected. Depending on the changes in deflection and transmission signals, variations in absorption mappings could be attributed to different origins of material inhomogenities or foreign particles. Also, lightprovoked changes in absorption that can occur with non-linear optical materials have been detected by the proposed method.
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H. Cattaneo, R. Botha, and C. Ziolek "UV absorption mapping as subsurface damage inspection in transparent optical materials", Proc. SPIE 11352, Optics and Photonics for Advanced Dimensional Metrology, 1135205 (1 April 2020); https://doi.org/10.1117/12.2555715
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KEYWORDS
Absorption
Ultraviolet radiation
Contamination
Optical inspection
Damage detection
Photothermal effect
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