Paper
27 November 1989 A Versatile Curved-Crystal Spectrometer
C. Senemaud, D. Laporte, J. M. Andre, R. Kherouf, P. Paquier, M. Ringuenet
Author Affiliations +
Abstract
A high resolution, curved-crystal spectrometer of compact design is described. It can be adapted to any X-ray source and covers the 0.5 to 10 nm wavelength range. The scanning of spectra is obtained by means of a novel mechanical arrangement using two coaxial rotary stages and a system of rotating arms. (patent nr 86.08871). The step-by-step scanning of spectra is driven by an Apple Ile microcomputer which is also used to perform the data acquisition for X-ray emission, X-ray absorption and isochromat spectra.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Senemaud, D. Laporte, J. M. Andre, R. Kherouf, P. Paquier, and M. Ringuenet "A Versatile Curved-Crystal Spectrometer", Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); https://doi.org/10.1117/12.961856
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Crystals

Spectroscopy

X-rays

Sensors

Absorption

Luminescence

Silicon

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