Soft X-Ray Microscopy In Laser-Plasmas

K. A. Tanaka; M Kado; R. Kodama; M. Ohtani; S. Kitamoto; T. Yamanaka; K. Yamashita; S. Nakai

doi:10.1117/12.961868

27 November 1989 Soft X-Ray Microscopy In Laser-Plasmas

K. A. Tanaka, M Kado, R. Kodama, M. Ohtani, S. Kitamoto, T. Yamanaka, K. Yamashita, S. Nakai

Proceedings Volume 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation; (1989) https://doi.org/10.1117/12.961868
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France

Abstract

X-ray microscopy is of extreme importance for measurement of plasma behavior in inertially confinement fusion. We have built a Schwarzschild type x-ray microscope for an x-ray wavelength of λ = 70Å. Nickel Carbon (Ni/C) multilayers have been tested for the normal incidence coating. Reported are critical points of the coating and characteristics of the microscope such as overall reflectivity and spatial resolution.

Citation Download Citation

K. A. Tanaka, M Kado, R. Kodama, M. Ohtani, S. Kitamoto, T. Yamanaka, K. Yamashita, and S. Nakai "Soft X-Ray Microscopy In Laser-Plasmas", Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); https://doi.org/10.1117/12.961868

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available