Paper
27 November 1989 Stigmatic Flat Fields Polychromators
M. Pouey
Author Affiliations +
Abstract
Actual flat field spectrometers suffer from a large amount of defect of focus. This is due to the fact that the object is actually located on the tangential focus, the detector being on the sagittal one. This is not the case if both the source and the detector are on the perpendicular to the grating normal at the sagittal curvature center. Astigmatism, sagittal coma and astigmatism vanish for any wavelengths, aplanetic solutions occurring for cylindrical (i = 73°39), spherical (i = 9°45) or toroidal (i = 28°5) gratings.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Pouey "Stigmatic Flat Fields Polychromators", Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); https://doi.org/10.1117/12.961849
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KEYWORDS
Monochromatic aberrations

Sensors

Spectrometers

Spherical lenses

Patents

Plasmas

X-rays

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