Determinations of detector optical reflections

Hubert Gardette; Sylvain Abdon

doi:10.1117/12.2558082

23 April 2020 Determinations of detector optical reflections

Hubert Gardette, Sylvain Abdon

Proceedings Volume 11406, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXI; 114060I (2020) https://doi.org/10.1117/12.2558082
Event: SPIE Defense + Commercial Sensing, 2020, Online Only

Abstract

Detectors used in imaging systems always generate optical reflections as the light is never completely absorbed. To estimate or measure the detector optical reflections permits to better manage the induced parasitic photonic signals (ghost and scattering) in imaging devices. We describe different methods to assess these detector reflections. Among them, a powerful test based on etalon effect in Focal Plan Array is detailed for measuring the reflection at different wavelengths even near the cut-off of the detector sensitivity. The physical effects in PV junctions that can explain the observed optical reflections are discussed.

Conference Presentation

Citation Download Citation

Hubert Gardette and Sylvain Abdon "Determinations of detector optical reflections", Proc. SPIE 11406, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXI, 114060I (23 April 2020); https://doi.org/10.1117/12.2558082

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