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12 March 2020 Temperature measurements by infrared thermal imaging system in thermal vacuum test
Yonghong Shang, Zeyuan Liu, Qinghua Gao, Xiangyu Zhao, Yabin Jian, Qiong Li
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Proceedings Volume 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 114391L (2020) https://doi.org/10.1117/12.2550264
Event: 2019 International Conference on Optical Instruments and Technology, 2019, Beijing, China
Abstract
Infrared thermal imaging technology receives infrared radiation from the measured object, and the temperature distribution will be changed into a visual image by signal processing system. In order to verify the accurate measurement, the temperature measurement experiment under vacuum environment was carried out by constructing the low temperature standard blackbody radiation source, which temperature range was from -80°C to +100°C and temperature control stability was better than ±0.05°C/30min. The general formula of the theoretic temperature of measured object surface is deduced under ultra-high vacuum and cryogenic environment, which was based on the principle of thermal radiation theory. The capability of long-wave infrared thermal imager was verified from -40°C to +60°C. The static characteristics of measurement accuracy, repeatability and linearity were analyzed, and the dynamic measurement characteristics were also tested. The results were compared with the fine thermocouple measurement data.
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Yonghong Shang, Zeyuan Liu, Qinghua Gao, Xiangyu Zhao, Yabin Jian, and Qiong Li "Temperature measurements by infrared thermal imaging system in thermal vacuum test", Proc. SPIE 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 114391L (12 March 2020); https://doi.org/10.1117/12.2550264
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KEYWORDS
Thermography
Temperature metrology
Imaging systems
Infrared imaging
Cryogenics
Heat flux
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