Paper
1 December 1989 Fourier Transform Raman Spectroscopy In The Near Infrared - Industrial Applications And Limitations
H. F. Shurvell, F. J. Bergin
Author Affiliations +
Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969419
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States
Abstract
In the past the application of Raman spectroscopy as an analytical tool has been severely restricted by laser induced fluorescence. It has been demonstrated recently 1,2, that near infrared Fourier Transform Raman spectroscopy can offer a solution to this problem. Near infrared laser excitation energy is, in general, too low to excite fluorescence. Unfortunately, the scattered Raman intensity is inversely proportional to the fourth power of the wavelength. This leads to a reduction in intensity of a factor of 22 on moving from 514.5 nm to 1064.1 nm excitation. Also, near infrared detectors are orders of magnitude less sensitive than photomultipliers used in conventional Raman spectroscopy. Despite these restrictions the FT-Raman technique opens up new possibilities for Raman spectroscopy.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
H. F. Shurvell and F. J. Bergin "Fourier Transform Raman Spectroscopy In The Near Infrared - Industrial Applications And Limitations", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); https://doi.org/10.1117/12.969419
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KEYWORDS
Raman spectroscopy

Fourier transforms

Near infrared

Chromium

Sensors

Optical filters

Spectroscopy

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