Paper
1 December 1989 IR Reflectance Properties Of Weakly And Strongly Absorbing Surface Films
Yu-Sze Yen, James S. Wong
Author Affiliations +
Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969426
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States
Abstract
In an external reflection measurement, the optical properties of a surface film can give rise to a variety of spectral behavior on metallic and nonmetallic substrates. The diversity of behavior can be explained by the presence of transverse optical (TO) and longitudinal optical (LO) bands of the film in the infrared region. The excitation modes associated with these bands are directional with respect to the plane of the surface. Spectral interpretation is facilitated by understanding the roles of the TO and LO bands in reflectance spectra, the substrate selection rules for the appearance of these bands, and the relationship between the TO and LO frequencies. We will show that weakly absorbing films have a simpler optical behavior than strongly absorbing films.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yu-Sze Yen and James S. Wong "IR Reflectance Properties Of Weakly And Strongly Absorbing Surface Films", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); https://doi.org/10.1117/12.969426
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KEYWORDS
Reflectivity

Silicon

Carbon

Gold

Absorption

Polymethylmethacrylate

Fourier spectroscopy

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