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1 December 1989 Influences Of Surface Reflection On Diffuse Reflectance Measurements
E. H. Korte, H. Staat
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Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969606
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States
Abstract
When the diffuse reflectance of samples with smooth surfaces such as varnishes, surface coatings, films etc. are to be measured, the regular (Fresnel) reflection at the surface can interfere in three ways: 1. If the regular reflected radiation reaches the detector, its dispersivelike features are superimposed on the diffuse reflectance spectrum; the resulting distortions are particularly severe, when the diffuse reflectance is low. 2. The regularly reflected radiation cannot contribute to the diffuse-reflection process, thus causing a baseline error. 3. Upon reaching the surface after having been diffusely reflected, the radiation is subjected to regular reflection again. Different from case 1, all angles of incidence are now possible so that even total reflection occurs. Since the reflected radiation undergoes the diffuse-reflection process again with the same probability of being ab-sorbed as before, the overall radiation emerging from the sample is decreased and this the more, the stronger an absorption band is. Results of calculations and experiments will be given and discussed.
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E. H. Korte and H. Staat "Influences Of Surface Reflection On Diffuse Reflectance Measurements", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); https://doi.org/10.1117/12.969606
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KEYWORDS
Reflection
Diffuse reflectance spectroscopy
Absorption
Sensors
Fourier spectroscopy
Fourier transforms
Spectroscopy
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