Direct assessment of crystalline order and stacking faults in layered hybrid perovskite films from x-ray scattering measurements

Wen Liang Tan; Christopher R. McNeill

doi:10.1117/12.2569651

20 August 2020 Direct assessment of crystalline order and stacking faults in layered hybrid perovskite films from x-ray scattering measurements

Wen Liang Tan, Christopher R. McNeill

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Proceedings Volume 11474, Organic, Hybrid, and Perovskite Photovoltaics XXI; 1147415 (2020) https://doi.org/10.1117/12.2569651
Event: SPIE Organic Photonics + Electronics, 2020, Online Only

Abstract

Ruddlesden-Popper layered perovskites have emerged as a promising solution for overcoming the moisture instability of three-dimensional hybrid perovskite materials. Given that the optoelectronic properties of these layered perovskites strongly depend on the dimensionality (n) of the phases present, understanding of the microstructure and order in such materials is important. Typically, the dimensionality of phases present is inferred from optical measurements rather than diffraction measurements which are a more direct probe of structural order. Here we use a combination of grazing-incidence transmission wide-angle X-ray scattering and transmission wide-angle X-ray scattering techniques to probe the in-plane microstructure of highly textured Ruddlesden-Popper films. Our analysis reveals that only diffraction peaks corresponding to n = 1, 2, 3 and ∞ phases are observed due to increasing disorder with increasing n. Evidence for stacking faults from X-ray measurements is also shown.

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Wen Liang Tan and Christopher R. McNeill "Direct assessment of crystalline order and stacking faults in layered hybrid perovskite films from x-ray scattering measurements", Proc. SPIE 11474, Organic, Hybrid, and Perovskite Photovoltaics XXI, 1147415 (20 August 2020); https://doi.org/10.1117/12.2569651

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KEYWORDS

Perovskite

X-rays

Scattering

Scatter measurement

Diffraction

Optical testing

Absorption

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