PROCEEDINGS VOLUME 11485
SPIE OPTICAL ENGINEERING + APPLICATIONS | 24 AUGUST - 4 SEPTEMBER 2020
Reflection, Scattering, and Diffraction from Surfaces VII
Editor(s): Leonard M. Hanssen
Proceedings Volume 11485 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
24 August - 4 September 2020
Online Only, California, United States
Front Matter: Volume 11485
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 1148501 (15 September 2020); doi: 10.1117/12.2581570
Chair Introduction
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 1148502 (20 August 2020); doi: 10.1117/12.2581844
Theory and Modeling I
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 1148503 (20 August 2020); doi: 10.1117/12.2568233
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 1148507 (20 August 2020); doi: 10.1117/12.2570623
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 1148508 (20 August 2020); doi: 10.1117/12.2570530
Instrumentation and Applications I
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850A (20 August 2020); doi: 10.1117/12.2569290
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850B (31 August 2020); doi: 10.1117/12.2568050
Measurement Methodology
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850D (20 August 2020); doi: 10.1117/12.2568502
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850E (20 August 2020); doi: 10.1117/12.2568365
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850F (20 August 2020); doi: 10.1117/12.2568553
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850G (20 August 2020); doi: 10.1117/12.2567960
Theory and Modeling II
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850H (20 August 2020); doi: 10.1117/12.2568042
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850I (20 August 2020); doi: 10.1117/12.2568046
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850J (20 August 2020); doi: 10.1117/12.2568578
Instrumentation and Applications II
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850K (20 August 2020); doi: 10.1117/12.2568179
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850M (15 September 2020); doi: 10.1117/12.2568347
Poster Session
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850N (20 August 2020); doi: 10.1117/12.2567116
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850O (20 August 2020); doi: 10.1117/12.2567372
Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850P (20 August 2020); doi: 10.1117/12.2568330
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