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20 August 2020 Spatial frequency domain Mueller matrix imaging to distinguish between birefringent materials in depth
Joseph Chue-Sang, Thomas A. Germer
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Proceedings Volume 11485, Reflection, Scattering, and Diffraction from Surfaces VII; 114850F (2020) https://doi.org/10.1117/12.2568553
Event: SPIE Optical Engineering + Applications, 2020, Online Only
Abstract
Mueller matrix polarimetry (MMP) is a technique capable of determining a material’s effect on polarized light. However, there are limiting factors that can be optimized to improve the quality of information that is collected using traditional MMP. One such issue lies in the full-field assessment of samples which gives a bulk assessment of a sample’s polarimetric properties and disallows specific structures to be distinguished between different depths as there would be in any non-uniform or multilayered sample. Spatial Frequency Domain Imaging (SFDI) is a well-documented technique that can be used to manipulate depth of penetration of an investigating light source through use of different [sinusoidal] frequency patterns. Higher frequency patterns can be used to restrict the depth of penetration for more superficial structure. The combined technique was used to investigate and differentiate between birefringent samples with varied depth-dependent structure.
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Joseph Chue-Sang and Thomas A. Germer "Spatial frequency domain Mueller matrix imaging to distinguish between birefringent materials in depth", Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850F (20 August 2020); https://doi.org/10.1117/12.2568553
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KEYWORDS
Polarimetry
Wave plates
Anisotropy
Calibration
Condition numbers
Light sources
Liquid crystals
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