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21 August 2020 Application of polycapillary optics to x-ray fluorescence for advanced spectroscopy and microscopy studies
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Advances in x-ray techniques, including x-ray optics, have paved the way to obtain challenging results in several research fields thanks to the improvement in terms of spatial resolution. This is particularly true for x-ray fluorescence (XRF), where the combination of conventional x-ray sources with polycapillary optics has permitted to have high flux and high focused beams. However, XRF spectroscopy applied to archeological samples at a lab scale is mainly dedicated to qualitative studies. At the same time, quantitative analysis still remains a strong hurdle mainly due to important matrix effects that affect the signal related to the chemical components under evaluation. In this respect the adoption of x-ray optics on both the source and the detector represents a way to improve the signal to noise ratio, necessary for quantitative analysis. At LNF XLab Frascati the expertise, gained on x-ray techniques and on polycapillary lenses, has allowed researchers to carry out advanced μXRF studies. RXR (Rainbow X-ray), is the experimental station dedicated to 2D/3D XRF micro-imaging and TXRF analysis, being equipped with 2 detectors of different energy efficiency (covering a full spectrum from 800 eV to 25 keV) and working in confocal mode with the source coupled with a full-lens and both the detectors combined with dedicated half-lenses. This report aims in depicting the RXR potentialities through the results obtained in 2 case studies dedicated to carry out a semi-quantitative analysis of 2 different artifacts (an ancient book, a Buddhist scroll) by μXRF characterization.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. Guglielmotti, D. Hampai, L. Micheli, C. Mazzuca, M. Redi, E. Gasbarri, and S. B. Dabagov "Application of polycapillary optics to x-ray fluorescence for advanced spectroscopy and microscopy studies", Proc. SPIE 11491, Advances in X-Ray/EUV Optics and Components XV, 114910D (21 August 2020);


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