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21 August 2020 X-ray diffraction in strongly bent crystals used as a spectrometer for X-ray Free-Electron Laser (XFEL) pulses
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Abstract
Theoretical studies of diffraction in strongly bent crystals applied to measuring spectra of X-ray Free-Electron Laser (XFEL) pulses are presented. It is shown that for bending radii below a threshold defined by the reflection the diffraction can be treated kinematically. Diffraction of XFEL pulses in bent crystals is simulated, and it is shown that the spectra can be resolved for the baseline parameters of European XFEL. The simulations help find the optimal parameters for the given experimental conditions. The possibilities of shot-to-shot spectroscopic studies and pulse duration estimation are discussed.
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Vladimir Kaganer, Ilia Petrov, Anders Madsen, and Liubov Samoylova "X-ray diffraction in strongly bent crystals used as a spectrometer for X-ray Free-Electron Laser (XFEL) pulses", Proc. SPIE 11493, Advances in Computational Methods for X-Ray Optics V, 114930T (21 August 2020); https://doi.org/10.1117/12.2569096
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