Calibration approach for a rotating polarizer analyzer polarimeter for retardance measurements

Francisco J. Cervantes Lozano; Geliztle A. Parra-Escamilla; Héctor Santiago-Hernández; Jorge L. Flores; Guillermo García-Torales; David I. Serrano-García

doi:10.1117/12.2569104

20 August 2020 Calibration approach for a rotating polarizer analyzer polarimeter for retardance measurements

Francisco J. Cervantes Lozano, Geliztle A. Parra-Escamilla, Héctor Santiago-Hernández, Jorge L. Flores, Guillermo García-Torales, David I. Serrano-García

Author Affiliations +

Proceedings Volume 11502, Infrared Remote Sensing and Instrumentation XXVIII; 115020Z (2020) https://doi.org/10.1117/12.2569104
Event: SPIE Optical Engineering + Applications, 2020, Online Only

Abstract

We present a calibration approach for rotating polarizer-analyzer polarimeter dedicated to retardance measurements. The rotating polarizer-analyzer polarimeter is based on retrieving a partial Mueller matrix measurement of a transparent sample to be later associated with its phase retardation properties. Through the Mueller matrix approach, we developed a calibration procedure considering the initial orientation of the two linear polarizers used, and we present experimental results showing the feasibility of our calibration approach.

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Francisco J. Cervantes Lozano, Geliztle A. Parra-Escamilla, Héctor Santiago-Hernández, Jorge L. Flores, Guillermo García-Torales, and David I. Serrano-García "Calibration approach for a rotating polarizer analyzer polarimeter for retardance measurements", Proc. SPIE 11502, Infrared Remote Sensing and Instrumentation XXVIII, 115020Z (20 August 2020); https://doi.org/10.1117/12.2569104

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