Paper
22 August 2020 Development of UV to IR band nanostructured antireflection coating technology for improved detector performance
Ashok K. Sood, John W. Zeller, Gopal G. Pethuraja, Adam W. Sood, Roger E. Welser, Parminder Ghuman, Sachidananda Babu, Sarath Gunapala
Author Affiliations +
Abstract
Broadband antireflection (AR) optical coatings covering the ultraviolet (UV) to infrared (IR) spectral bands have many potential applications for various NASA systems. The performance of these systems is substantially limited by signal loss due to reflection off substrates and optical components. Tunable nanoengineered optical layers offer omnidirectional suppression of light reflection/scattering with increased optical transmission to enhance detector and system performance. Nanostructured AR coatings enable realization of optimal AR coatings with high laser damage thresholds and reliability in extreme low temperature environments and under launch conditions for various NASA applications. We are developing and advancing high-performance AR coatings on various substrates for spectral bands ranging from the UV to IR. The nanostructured AR coatings enhance the transmission of light through optical components and devices by significantly minimizing reflection losses, providing substantial improvements over conventional thin film AR coating technologies. The optical properties of the AR coatings have been measured and fine-tuned to achieve high levels of performance. In this paper, we review our latest work on high performance nanostructure-based AR coatings, including recent efforts in the development of the nanostructured AR coatings for UV band applications.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ashok K. Sood, John W. Zeller, Gopal G. Pethuraja, Adam W. Sood, Roger E. Welser, Parminder Ghuman, Sachidananda Babu, and Sarath Gunapala "Development of UV to IR band nanostructured antireflection coating technology for improved detector performance", Proc. SPIE 11503, Infrared Sensors, Devices, and Applications X, 115030N (22 August 2020); https://doi.org/10.1117/12.2571233
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KEYWORDS
Antireflective coatings

Nanostructuring

Silicon

Reflection

Ultraviolet radiation

Gallium antimonide

Refractive index

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