18 September 2020Investigation of excitation dynamics in HfO2 and SiO2 monolayers using subpicosecond pump-and-probe damage testing (Withdrawal Notice)
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This presentation, originally published on 11 September 2020, was withdrawn per author request.
Kafka, Hoffman, Kozlov, and Demos: Investigation of excitation dynamics in HfO2 and SiO2 monolayers using subpicosecond pump-and-probe damage testing (Withdrawal Notice)
Kyle R. P. Kafka,Brittany N. Hoffman,Alexei A. Kozlov, andStavros G. Demos
"Investigation of excitation dynamics in HfO2 and SiO2 monolayers using subpicosecond pump-and-probe damage testing (Withdrawal Notice)", Proc. SPIE 11514, Laser-induced Damage in Optical Materials 2020, 1151411 (18 September 2020); https://doi.org/10.1117/12.2571240
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Kyle R. P. Kafka, Brittany N. Hoffman, Alexei A. Kozlov, Stavros G. Demos, "Investigation of excitation dynamics in HfO2 and SiO2 monolayers using subpicosecond pump-and-probe damage testing (Withdrawal Notice)," Proc. SPIE 11514, Laser-induced Damage in Optical Materials 2020, 1151411 (18 September 2020); https://doi.org/10.1117/12.2571240