Probe-based hyperspectral imager for crop monitoring

Maria Merin Antony; C. S. Suchand Sandeep; Murukeshan Vadakke Matham

doi:10.1117/12.2576153

8 November 2020 Probe-based hyperspectral imager for crop monitoring

Maria Merin Antony, C. S. Suchand Sandeep, Murukeshan Vadakke Matham

Proceedings Volume 11525, SPIE Future Sensing Technologies; 1152512 (2020) https://doi.org/10.1117/12.2576153
Event: SPIE Future Sensing Technologies, 2020, Online Only

Abstract

Automated crop monitoring techniques help in better management of growing conditions in order to improve quality and yield, and to reduce the impact on the environment. Various stages of a crop in its life cycle is noticeable with a change in its leaf color. The yellowing of leaf is considered as an important quality defect in green leafy vegetables. Yellowing is initiated at the end of maturity stage and continues in the senescence stage. Most of the methods used for monitoring leaf quality requires the detachment of the leaf from the plant, which is destructive in nature. Among the several nondestructive techniques available, hyperspectral imaging (HSI) modality offers the possibility to address this problem by monitoring the reflection spectrum of the leaf in situ. When the freshness of the leaf reduces, the chlorophyll content in the leaf decreases. This results in an increase in its reflectance in the visible region as the absorption of light by chlorophyll reduces. Hence, the reflection spectrum can be used as a measure for the freshness of the leaf. However, monitoring large areas usually require translation of the whole imaging system or removal of the leaf from the plant. In this context, we propose to use a flexible probe-based HSI system to mitigate these issues. We demonstrate the adoption of a probe based HSI modality to enable in situ live plant monitoring. The classification of the leaves from the HSI data is performed using principal component analysis (PCA) technique.

Conference Presentation

Citation Download Citation

Maria Merin Antony, C. S. Suchand Sandeep, and Murukeshan Vadakke Matham "Probe-based hyperspectral imager for crop monitoring", Proc. SPIE 11525, SPIE Future Sensing Technologies, 1152512 (8 November 2020); https://doi.org/10.1117/12.2576153

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available