Poster + Paper
10 October 2020 Single and multi-pulse 266nm nanosecond solid-state laser ablation of SiC
X. Li, Z. Tian, L. Qi
Author Affiliations +
Conference Poster
Abstract
In this paper, 266 nm nanosecond solid-state laser machining of SiC was experimentally investigated. Atomic force microscope and optical microscopy are used to detect the ablation morphology of specimens. The changes in the diameter of the ablated holes and depth of single and multi-pulse laser ablation of SiC were studied and the removal mechanism was analyzed. The results show that in the single-pulse ablation experiment, as the laser energy density increases, the diameter of the ablated holes gradually increases, and the ablation depth increases first and then decreases. In the multi-pulse machining experiment, the average depth per pulse increases as the laser density increasing when the number of the laser pulse is less than 125 pulses. When the number of laser pulses is more than 125 pulses, the average depth per pulse increases as the laser density at lower laser density; whereas, the average depth per pulse keeps a constant value at higher laser density.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
X. Li, Z. Tian, and L. Qi "Single and multi-pulse 266nm nanosecond solid-state laser ablation of SiC", Proc. SPIE 11546, Advanced Laser Processing and Manufacturing IV, 115460Q (10 October 2020); https://doi.org/10.1117/12.2575058
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Laser ablation

Silicon carbide

Solid state lasers

Laser energy

Pulsed laser operation

Atomic force microscope

Micromachining

RELATED CONTENT

Mid-ultraviolet pulsed laser micromachining of SiC
Proceedings of SPIE (November 18 2014)
Nanostructures for formation on surface of 6H SiC by laser...
Proceedings of SPIE (November 19 2003)
Nanosecond laser silicon micromachining
Proceedings of SPIE (July 15 2004)
Femtosecond laser ablation of copper
Proceedings of SPIE (February 19 2003)

Back to Top