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10 October 2020 Sub-diffraction dark spot localization microscopy
Chuankang Li, Yuzhu Li, Yuhang Li, Shaocong Liu, Zhengyi Zhan, Xiang Hao, Cuifang Kuang, Xu Liu
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Proceedings Volume 11549, Advanced Optical Imaging Technologies III; 115491F (2020) https://doi.org/10.1117/12.2574606
Event: SPIE/COS Photonics Asia, 2020, Online Only
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Abstract
Recently, a new technique called MINFLUX was promoted and attained ~1-nanometer precision. However, MINFLUX is incapable of discerning two molecules within the diffraction-limited region unless with the help of on-off switching scheme of SMLM which yet entails time-consuming processes. Here, we produce a novel kind of focal spot pattern, called sub-diffraction dark spot, to localize molecules within the sub-diffraction region of interest. In our proposed technique nominated as sub-diffracted dark spot localization microscopy (SDLM), multiple molecules within the diffraction-limited region could be distinguished without the requirement of fluorescent switches. We have numerically presented the SDLM modality and some impacts, like intensity, are investigated. Simulative localization framework has been implemented on randomly-distributed and specifically-structured samples. SDLM is evidenced to have high localization accuracy and stability in densely-packed fluorescent solution.
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Chuankang Li, Yuzhu Li, Yuhang Li, Shaocong Liu, Zhengyi Zhan, Xiang Hao, Cuifang Kuang, and Xu Liu "Sub-diffraction dark spot localization microscopy", Proc. SPIE 11549, Advanced Optical Imaging Technologies III, 115491F (10 October 2020); https://doi.org/10.1117/12.2574606
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KEYWORDS
Microscopy
Molecules
Diffraction
Photodetectors
Photon counting
Super resolution microscopy
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