Comparison measurement of absolute power responsivity of silicon photodetector between He-Ne laser and supercontinuum white light source

Nan Xu; Haiyong Gan; Yangyang Wang; Yingwei He; Wende Liu; Ruoduan Sun; Yandong Lin

doi:10.1117/12.2573635

10 October 2020 Comparison measurement of absolute power responsivity of silicon photodetector between He-Ne laser and supercontinuum white light source

Nan Xu, Haiyong Gan, Yangyang Wang, Yingwei He, Wende Liu, Ruoduan Sun, Yandong Lin

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Proceedings Volume 11552, Optical Metrology and Inspection for Industrial Applications VII; 115521A (2020) https://doi.org/10.1117/12.2573635
Event: SPIE/COS Photonics Asia, 2020, Online Only

Conference Poster

Abstract

A comparison measurement of absolute power responsivity of silicon photodetector between He-Ne laser and supercontinuum white light source has been realized recently. The power responsivity of silicon trap detector at 632.8nm has been transferred from NIM’s primary optical power standard-the absolute cryogenic radiometer. A 0.07% difference was present for the two different light sources at the same wavelength. Also, a series of experiments related to the comparison have been done including measurement of source power stability, detector polarization dependence, uniformity, and angular dependence. At last, the measurement uncertainty of the comparison is analyzed.

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Nan Xu, Haiyong Gan, Yangyang Wang, Yingwei He, Wende Liu, Ruoduan Sun, and Yandong Lin "Comparison measurement of absolute power responsivity of silicon photodetector between He-Ne laser and supercontinuum white light source", Proc. SPIE 11552, Optical Metrology and Inspection for Industrial Applications VII, 115521A (10 October 2020); https://doi.org/10.1117/12.2573635

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