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28 July 1989 Development Of A Normal Incidence Multilayer, Imaging X-Ray Microscope
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Abstract
Normal incidence multilayer x-ray mirror technology has now advanced to the point that high resolution x-ray microscopes with relatively large fields of view are feasible. High resolution aplanatic imaging x-ray microscopes configured from low x-ray scatter normal incidence multilayer optics should be ideal for laser fusion research, biological investigations, and for astronomical studies when used in conjunction with grazing incidence or multilayer x-ray telescope systems. We have designed several Schwarzschild x-ray microscope optics. Diffraction analysis indicates better than 400 A spatial res-olution in the object plane up to a 1 mm field of view can be achieved with 125 A radiation . We are currently fabricating a 20x normal incidence multilayer x-ray microscope of 1.35 meter overall length. We have also analyzed and designed other microscope systems for use in conjunction with x-ray telescopes. We report on the results of these studies and the x-ray microscope fabrication effort.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David L. Shealy, Richard B. Hoover, Arthur B.C. Walker Jr., and Troy W. Barbee Jr. "Development Of A Normal Incidence Multilayer, Imaging X-Ray Microscope", Proc. SPIE 1160, X-Ray/EUV Optics for Astronomy and Microscopy, (28 July 1989); https://doi.org/10.1117/12.962633
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