Poster + Presentation
22 February 2021 Study of further image performance improvement by spectral bandwidth for ArFi lithography lightsource
Author Affiliations +
Conference Poster
Abstract
DUV lightsources used in lithography process is enabling to shrink the feature size as a driver for Moore’s Law in order to make semiconductor devices to a new level. Multi-patterning processes has been applied to break through the ArFi resolution limit. These processes require the pattern fidelity and placement accuracy.We have studied an impact of bandwidth distribution and asymmetry by imaging simulation. The results show the bandwidth shape and asymmetry cause a change in the CD. Our study shows that Gigaphoton‘s latest light source can contribute to improvements of fidelity and EPE.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takamitsu Komaki, Shinichi Matsumoto, Koichi Fujii, Takehiko Tomonaga, Taku Yamazaki, and Toshihiro Oga "Study of further image performance improvement by spectral bandwidth for ArFi lithography lightsource", Proc. SPIE 11611, Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV, 116112T (22 February 2021); https://doi.org/10.1117/12.2583731
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KEYWORDS
Lithography

Deep ultraviolet

Error analysis

Optical proximity correction

Semiconductors

Extreme ultraviolet

Optical engineering

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