Structural Analysis Using Phase-Stepped, Double Pulsed ESPI

J. R. Tyrer

doi:10.1117/12.962742

25 April 1990 Structural Analysis Using Phase-Stepped, Double Pulsed ESPI

J. R. Tyrer

Proceedings Volume 1162, Laser Interferometry: Quantitative Analysis of Interferograms: Third in a Series; (1990) https://doi.org/10.1117/12.962742
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

Optical whole-field testing techniques have been carrots dangled in front of engineers' noses for a considerable period of time. The promise of acquiring meaningful data without upsetting the component nor its environment, has significant attractions. ESPI technology has been modified and pursued with these goals in mind. This paper presents some of the recent work containing several developments which now make the engineering realisations a near term possibility. An overview of the correlation imaging mechanism is presented with a discussion on how this principle type of optical interferometer can be configured to provide the data necessary for analytical use. Attempts to produce instrumentation able to function outside the laboratory have required replacement of continuous wave lasers with Nd.YAG pulsed lasers. The new pulsed lasers are able to be combined with the computer based fringe pattern analysis which has been produced to suit the requirements of the engineer. Experimental results using such equipment are presented and further work is included which demonstrates the ability for speckle interferometry to produce three-dimensional analysis with the data being presented in conventional cartesian form.

Citation Download Citation

J. R. Tyrer "Structural Analysis Using Phase-Stepped, Double Pulsed ESPI", Proc. SPIE 1162, Laser Interferometry: Quantitative Analysis of Interferograms: Third in a Series, (25 April 1990); https://doi.org/10.1117/12.962742

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