The Prediction Of BRDFs From Surface Profile Measurements

E. L. Church; P. Z. Takacs; T. A. Leonard

doi:10.1117/12.962842

2 January 1990 The Prediction Of BRDFs From Surface Profile Measurements

E. L. Church, P. Z. Takacs, T. A. Leonard

Proceedings Volume 1165, Scatter from Optical Components; (1990) https://doi.org/10.1117/12.962842
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

This paper discusses methods of predicting the BRDF of smooth surfaces from profile measurements of their surface finish. The conversion of optical profile data to the BRDF at the same wavelength is essentially independent of scattering models, while the conversion of mechanical measurements, and wavelength scaling in general, are model dependent. Procedures are illustrated for several surfaces, including two from the recent HeNe BRDF round robin, and results are compared with measured data. Reasonable agreement is found except for surfaces which involve significant scattering from isolated surface defects which are poorly sampled in the profile data.

Citation Download Citation

E. L. Church, P. Z. Takacs, and T. A. Leonard "The Prediction Of BRDFs From Surface Profile Measurements", Proc. SPIE 1165, Scatter from Optical Components, (2 January 1990); https://doi.org/10.1117/12.962842

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