Optical Sensor Designs For The Detection Of Cracks In Optical Materials

J. R. Hodor; H. J. Decker Jr.; J. Barney

doi:10.1117/12.962978

22 December 1989 Optical Sensor Designs For The Detection Of Cracks In Optical Materials

J. R. Hodor, H. J. Decker Jr., J. Barney

Proceedings Volume 1168, Current Developments in Optical Engineering and Commercial Optics; (1989) https://doi.org/10.1117/12.962978
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

With the advent of new materials for solar cells, such as gallium arsenide, and of thinner materials used in larger flexible solar arrays, such as silicon and protective filter glasses, has come the need for improved methods for the detection of cracks in the optical materials that compose the components of each. Four basic sensor designs have been conceived for use with visibly transmissive, as well as visibly opaque materials. Based upon their specific optical approach, the designs are called brightfield, quasi-brightfield, darkfield reflective and darkfield transmissive. All of these designs rely upon the fact that the crack's cleavage in the material provides a total or near total internal reflection boundary. The basic design simply involves an irradiation source, to which the material is transmissive, and a video camera, which is sensitive to the source's radiation transmitted into and out of the material. Two of the designs have only been demonstrated and await further development, when their need arrives. The other two designs have been developed for specific applications and have been integrated into the production environment at this time. They are proven, viable sensor designs. All of these designs facilitate the extrapolation of the basic crack detection process to future machine vision automation.

Citation Download Citation

J. R. Hodor, H. J. Decker Jr., and J. Barney "Optical Sensor Designs For The Detection Of Cracks In Optical Materials", Proc. SPIE 1168, Current Developments in Optical Engineering and Commercial Optics, (22 December 1989); https://doi.org/10.1117/12.962978

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available