Coupling characteristic analysis and refractive index sensing based on in-line Michelson interferometer

Yundong Zhang; Kaiyue Qi; Jianfeng Sun; Ying Guo; Fuxing Zhu

doi:10.1117/12.2586524

5 March 2021 Coupling characteristic analysis and refractive index sensing based on in-line Michelson interferometer

Yundong Zhang, Kaiyue Qi, Jianfeng Sun, Ying Guo, Fuxing Zhu

Proceedings Volume 11700, Optical and Quantum Sensing and Precision Metrology; 117003V (2021) https://doi.org/10.1117/12.2586524
Event: SPIE OPTO, 2021, Online Only

Abstract

A refractive index (RI) sensor based on three microspheres array (TMSA) Michelson interferometer (MI) is proposed and experimentally demonstrated. The sensor was composed of a TMSA which introduces higher-order cladding mode and a section of silica fiber which is used to transmit light. Due to the flatness and cleanliness requirements of Michelson’s Fresnel reflector, a special packaging method by microtubule was used to protect the end face. The coupling efficiency between the core and the cladding of MI is proved by the coupled mode theory. The results show that the greater the effective refractive index difference (ERID) between different modes, the greater the coupling coefficient can be obtained, and the TMSA achieves the improvement in the ERID between modes. The interference arm of the sensor is 2.7cm, and the size of the microsphere is less than 230 μm. It is discussed in further detail that the order of the excited cladding mode is closely related to the sensitivity of the RI sensing. The experimental results show that the sensitivity of the RI is -56.121nm/RIU. The characteristics of TMSA make it suitable for operation in a variable environment without cross-sensitivity, which may open up new avenues for local temperature sensing.

Conference Presentation

Citation Download Citation

Yundong Zhang, Kaiyue Qi, Jianfeng Sun, Ying Guo, and Fuxing Zhu "Coupling characteristic analysis and refractive index sensing based on in-line Michelson interferometer", Proc. SPIE 11700, Optical and Quantum Sensing and Precision Metrology, 117003V (5 March 2021); https://doi.org/10.1117/12.2586524

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available