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12 April 2021 Fabrication and analysis of speckle masks for optimal system design in higher energy speckle-based XPCI
Amber L. Dagel, Roger D West, Burke L Kernen, Collin J.C. Epstein, Johnathan Mulcahy-Stanislawczyk, Kyle R. Thompson, Patrick S Finnegan
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Proceedings Volume 11738, Anomaly Detection and Imaging with X-Rays (ADIX) VI; 117380H (2021) https://doi.org/10.1117/12.2592011
Event: SPIE Defense + Commercial Sensing, 2021, Online Only
Abstract
Speckle-based X-ray phase contrast imaging (XPCI) is a relatively simple implementation of phase contrast imaging. At low energies, the technique has been demonstrated with masks made from steel wool and sandpaper. However, these materials are too transparent for higher energy applications. The simple geometry and easy identification of, or fabrication of, materials for relevant speckle masks make speckle-based XPCI a compelling technique for widespread use. We have analyzed the trade space for higher energy speckle-based XPCI systems based on portable X-ray tube sources. We have demonstrated several fabrication techniques compatible with a range of materials. Together these enable variation in feature size, material density, and randomness in the mask. This ability to tune the mask parameters allows optimization of the mask for the application space and system design.
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Amber L. Dagel, Roger D West, Burke L Kernen, Collin J.C. Epstein, Johnathan Mulcahy-Stanislawczyk, Kyle R. Thompson, and Patrick S Finnegan "Fabrication and analysis of speckle masks for optimal system design in higher energy speckle-based XPCI", Proc. SPIE 11738, Anomaly Detection and Imaging with X-Rays (ADIX) VI, 117380H (12 April 2021); https://doi.org/10.1117/12.2592011
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KEYWORDS
Speckle
Absorption
X-rays
Metals
Phase contrast
X-ray imaging
Materials processing
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