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28 February 2021 Research on FPGA-based laser measuring instrument for surface flatness
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Proceedings Volume 11781, 4th Optics Young Scientist Summit (OYSS 2020); 117811G (2021) https://doi.org/10.1117/12.2591311
Event: Optics Frontier: Optics Young Scientist Summit, 2020, Ningbo, China
Abstract
Strip flatness is an important indicator of steel quality, and its detection technology has always been the focus of research at home and abroad. This paper proposes a non-contact online real-time measurement scheme for hot rolled strip steel. Our research is based on the laser triangulation method, which transforms the flatness detection into the strip surface height detection. In order to prevent errors caused by jitter during strip transportation, we have added a three-point measurement method. The flatness measurement system has carried out the system hardware design with FPGA and linear CCD as the core and the system software design with the laser spot positioning as the core. The basic technology realization process is based on FPGA as the main control and processing chip, collecting the laser reflection light signal of the measured strip steel surface through the optical system through the linear array CCD to obtain the strip surface height information. The collected signals are subjected to photoelectric conversion, filtering and amplification, and A/D conversion, and are transmitted through a network port based on UDP protocol. Finally, the spot center is positioned by comparing the selected threshold method to obtain important data for calculating the flatness information. In this study, a semiconductor laser with a wavelength of 450nm, a TCD1304AP linear CCD and an FPGA chip of the XC7A35T model produced by Xilinx were selected. In the range of 4 mm above and below the reference position, the measurement accuracy of the system can reach 10μm, which meets the measurement requirements of the measured strip elongation accuracy of 1% (when the elongation is 10~200 I) or 1 I (when the elongation is less than 1 I).
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ying Meng, Wenjian Chen, Wusen Li, and Yuwei Zhao "Research on FPGA-based laser measuring instrument for surface flatness", Proc. SPIE 11781, 4th Optics Young Scientist Summit (OYSS 2020), 117811G (28 February 2021); https://doi.org/10.1117/12.2591311
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