Single-pulse spectrometer for hard x-ray free electron lasers

Liu Xing; Kaiyu Zhang; Peng Liu; Shengzhen Yi; Tsu-Chien Weng

doi:10.1117/12.2625095

27 March 2022 Single-pulse spectrometer for hard x-ray free electron lasers

Liu Xing, Kaiyu Zhang, Peng Liu, Shengzhen Yi, Tsu-Chien Weng

Proceedings Volume 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications; 1216982 (2022) https://doi.org/10.1117/12.2625095
Event: Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 2021, Kunming, China

Abstract

In many single-pulse experiments of X-ray free electron lasers, the spectrum and intensity distribution of the self-amplifying spontaneous radiation beams fluctuate significantly. It is necessary to perform accurate spectral characterization of each pulse. In this paper, we present an in-line spectrometer that can observe the distribution of energy and incident intensity of single pulse X-ray photons in real time. The X-ray diffraction is achieved by using a high precision transmission crystal bending to fixed pressure bending, and the spectrum is recorded by a spatial resolution detector. At the same time, most of the incident flux is transmitted to the downstream experiment. In this paper, based on the X-ray crystal diffraction theory, geometric optical path designs were carried out, high-precision transmission curved-crystal with fixed bending was developed, the optical path of in-line transmission spectrometer was built, and the copper Kα1 and Kα2 obtained by the test were used for spectral calibration. The experimental results show that each pixel on the detector corresponds to 0.43eV, and the half-width of Kα1 is 3.44 eV. The Single-pulse spectrometer can be used for hard x-ray free electron lasers spectroscopy experiments.

Citation Download Citation

Liu Xing, Kaiyu Zhang, Peng Liu, Shengzhen Yi, and Tsu-Chien Weng "Single-pulse spectrometer for hard x-ray free electron lasers", Proc. SPIE 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 1216982 (27 March 2022); https://doi.org/10.1117/12.2625095

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