High-uniformity TiN/Ti/TiN multilayers for the development of Microwave Kinetic Inductance Detectors

Mario De Lucia; E. Baldwin; G. Ulbricht; J. D. Piercy; O. Creaner; C. Bracken; T. P. Ray

doi:10.1117/12.2626867

29 August 2022 High-uniformity TiN/Ti/TiN multilayers for the development of Microwave Kinetic Inductance Detectors

Mario De Lucia, E. Baldwin, G. Ulbricht, J. D. Piercy, O. Creaner, C. Bracken, T. P. Ray

Proceedings Volume 12191, X-Ray, Optical, and Infrared Detectors for Astronomy X; 1219105 (2022) https://doi.org/10.1117/12.2626867
Event: SPIE Astronomical Telescopes + Instrumentation, 2022, Montréal, Québec, Canada

Abstract

Microwave Kinetic Inductance Detectors (MKIDs) are a class of superconducting cryogenic detectors that simultaneously exhibit energy resolution, time resolution and spatial resolution. The pixel yield of MKID arrays is usually a critical figure of merit in the characterisation of an MKIDs array. Currently, for MKIDs intended for the detection of optical and near-infrared photons, only the best arrays exhibit a pixel yield as high as 75-80%. The uniformity of the superconducting film used for the fabrication of MKIDs arrays is often regarded as the main limiting factor to the pixel yield of an array. In this paper we will present data on the uniformity of the TiN/Ti/TiN multilayers deposited at the Tyndall National Institute and compare these results with a statistical model that evaluates how inhomogeneities affect the pixel yield of an array.

Conference Presentation

Citation Download Citation

Mario De Lucia, E. Baldwin, G. Ulbricht, J. D. Piercy, O. Creaner, C. Bracken, and T. P. Ray "High-uniformity TiN/Ti/TiN multilayers for the development of Microwave Kinetic Inductance Detectors", Proc. SPIE 12191, X-Ray, Optical, and Infrared Detectors for Astronomy X, 1219105 (29 August 2022); https://doi.org/10.1117/12.2626867

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