3 October 2022Multiscale characterization of nanostructure and dynamic processes in nanoporous composite materials using a correlative approach with ptychographic X-ray tomography and scanning small-angle X-ray scattering (Conference Presentation)
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
This works illustrates the capability of scanning Small-Angle X-ray Scattering (sSAXS) and Ptychographic X-ray nano Tomography (PXCT) to characterize nanoporous composite materials over multiple length scales on a fuel cell catalyst. Results comprise direct images of the nanostructure in a 30µm catalyst pillar at 20 nm resolution in combination with statistically averaged information of the nanostructure between 1-200nm from sSAXS with a spatial resolution of few tens of µm over macroscopic areas. The ex-situ material study is complemented by in-situ dynamic imaging of vapor condensation in 3D at 20nm spatial and temporal resolution of 10minutes.
Christian Appel,Zirui Gao,Bastian J.M. Etzold,Marianne Liebi, andManuel Guizar-Sicairos
"Multiscale characterization of nanostructure and dynamic processes in nanoporous composite materials using a correlative approach with ptychographic X-ray tomography and scanning small-angle X-ray scattering (Conference Presentation)", Proc. SPIE 12242, Developments in X-Ray Tomography XIV, 122420B (3 October 2022); https://doi.org/10.1117/12.2633570
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Christian Appel, Zirui Gao, Bastian J.M. Etzold, Marianne Liebi, Manuel Guizar-Sicairos, "Multiscale characterization of nanostructure and dynamic processes in nanoporous composite materials using a correlative approach with ptychographic X-ray tomography and scanning small-angle X-ray scattering (Conference Presentation)," Proc. SPIE 12242, Developments in X-Ray Tomography XIV, 122420B (3 October 2022); https://doi.org/10.1117/12.2633570