UV photo-method for measurement of MCP characteristic parameters

Jingquan Tian

doi:10.1117/12.2294719

1 July 1990 UV photo-method for measurement of MCP characteristic parameters

Jingquan Tian

Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 12302A (1990) https://doi.org/10.1117/12.2294719
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States

Abstract

In this paper, the measurement unit and the operating principle are introduced. The key problems are represented. The experimental results are given and peculiar advantages of this method are pointed out.

Citation Download Citation

Jingquan Tian "UV photo-method for measurement of MCP characteristic parameters", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12302A (1 July 1990); https://doi.org/10.1117/12.2294719

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available