Self-reference photonic sampling measurement of photodiode chips with microwave de-embedding

Yutong He; Chao Jing; Mengke Wang; Ying Xu; Yali Zhang; Zhiyao Zhang; Shangjian Zhang; Yong Liu

doi:10.1117/12.2642304

27 December 2022 Self-reference photonic sampling measurement of photodiode chips with microwave de-embedding

Yutong He, Chao Jing, Mengke Wang, Ying Xu, Yali Zhang, Zhiyao Zhang, Shangjian Zhang, Yong Liu

Proceedings Volume 12311, Semiconductor Lasers and Applications XII; 1231106 (2022) https://doi.org/10.1117/12.2642304
Event: SPIE/COS Photonics Asia, 2022, Online Only

Abstract

An improved self-reference photonic sampling method is proposed to measure the frequency response of photodiode (PD) chips. In the proposed scheme, the uneven response of the Mode-Locked Laser Source (MLLS) is eliminated by using the half-frequency photonic sampling measurements. The microwave de-embedding under short-open-load-device termination is used to realize on-chip de-embedding of the adapter network connected to the receiver of the microwave network analyzer in terms of the transmission loss and the impedance mismatch. The proposed on-chip measurement method is free of any extra electro-optical transducer standard, and an accurate measurement can still be realized without an impedance match.

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Citation Download Citation

Yutong He, Chao Jing, Mengke Wang, Ying Xu, Yali Zhang, Zhiyao Zhang, Shangjian Zhang, and Yong Liu "Self-reference photonic sampling measurement of photodiode chips with microwave de-embedding", Proc. SPIE 12311, Semiconductor Lasers and Applications XII, 1231106 (27 December 2022); https://doi.org/10.1117/12.2642304

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