Massively parallel confocal dark field microscopy

James Napier; Markus Schellenberg; Gerhard Kauer; Walter Neu

doi:10.1117/12.2649843

15 March 2023 Massively parallel confocal dark field microscopy

James Napier, Markus Schellenberg, Gerhard Kauer, Walter Neu

Proceedings Volume 12435, Emerging Digital Micromirror Device Based Systems and Applications XV; 1243504 (2023) https://doi.org/10.1117/12.2649843
Event: SPIE OPTO, 2023, San Francisco, California, United States

Abstract

A new technique which combines the advantages of darkfield microscopy with those of confocal microscopy has been developed. The Massively Parallel Confocal darkfield method implemented on a DMD-based confocal platform allows for detection of non-fluorescing particles with dimensions below the diffraction limit. The lateral resolution and depth discrimination of three dimensional objects are improved relative to conventional darkfield microscopy.

Conference Presentation

Citation Download Citation

James Napier, Markus Schellenberg, Gerhard Kauer, and Walter Neu "Massively parallel confocal dark field microscopy", Proc. SPIE 12435, Emerging Digital Micromirror Device Based Systems and Applications XV, 1243504 (15 March 2023); https://doi.org/10.1117/12.2649843

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