Intra-detector x-ray scatterings in edge-on irradiated silicon photon counting CT: how to harvest information from scattered photons

Ke Li; Christian De Caro; Ran Zhang; Guang-Hong Chen

doi:10.1117/12.2654227

7 April 2023 Intra-detector x-ray scatterings in edge-on irradiated silicon photon counting CT: how to harvest information from scattered photons

Ke Li, Christian De Caro, Ran Zhang, Guang-Hong Chen

Author Affiliations +

Proceedings Volume 12463, Medical Imaging 2023: Physics of Medical Imaging; 124630D (2023) https://doi.org/10.1117/12.2654227
Event: SPIE Medical Imaging, 2023, San Diego, California, United States

Abstract

Si has multiple attractive semiconductive properties to be used as a radiation sensor material in photon counting detectors. Additionally, the abundance and mature manufacturing technologies of Si have made high-purity Si readily available at low costs. Among physical interactions between x-rays and Si, the majority are expected to be Compton and Rayleigh scatterings due to the low atomic number of Si. In this work, the percentage and destinies of scattered x-ray photons were quantified both experimentally and numerically. The results have guided us to optimize the Si PCD configuration for more efficient utilization of the side-scattered photons.

Conference Presentation

Citation Download Citation

Ke Li, Christian De Caro, Ran Zhang, and Guang-Hong Chen "Intra-detector x-ray scatterings in edge-on irradiated silicon photon counting CT: how to harvest information from scattered photons", Proc. SPIE 12463, Medical Imaging 2023: Physics of Medical Imaging, 124630D (7 April 2023); https://doi.org/10.1117/12.2654227

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