Presentation + Paper
14 June 2023 Spectral gratings-based phase-contrast imaging for materials characterization
Andrew J. Gilbert, Adam C. Denny, Aileen N. Sarceno, Richard S. Wittman, Erin A. Miller
Author Affiliations +
Abstract
Spectral X-ray detectors provide a direct observation of the energy spectrum of a transmitted X-ray beam, both for typical and phase-contrast gratings-based systems. The sensitivity of a gratings-based X-ray system to small-angle deflections from a given particle size is dependent on X-ray energy. Therefore, spectral (energy-sensitive) detectors could be sensitive to particle size, even with a broad spectrum from a commercial X-ray generator. Furthermore, these detectors allow direct observation of how the X-ray spectrum is changing as the beam is passing through an object and gratings, and how this affects grating visibilities used to determine the presence of small-angle deflections. This is a particular issue for higher-energy systems where artifacts from beam hardening are common. We present results exploring the particle-size dependent signatures that are available from a spectral gratings-based phase-contrast X-ray imaging system, and the feasibility of observing them with lab-based, broad-spectrum X-ray generators.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew J. Gilbert, Adam C. Denny, Aileen N. Sarceno, Richard S. Wittman, and Erin A. Miller "Spectral gratings-based phase-contrast imaging for materials characterization", Proc. SPIE 12531, Anomaly Detection and Imaging with X-Rays (ADIX) VIII, 125310G (14 June 2023); https://doi.org/10.1117/12.2663669
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KEYWORDS
X-rays

Particles

Microspheres

Radiography

Scattering

Phase contrast

Photon counting

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