Paper
6 April 2023 A new test method for digital-to-analog converter
Mengzhang Cheng
Author Affiliations +
Proceedings Volume 12615, International Conference on Signal Processing and Communication Technology (SPCT 2022); 126151U (2023) https://doi.org/10.1117/12.2673944
Event: International Conference on Signal Processing and Communication Technology (SPCT 2022), 2022, Harbin, China
Abstract
A new BIST (Built-In Self-Test) method to test static parameters of a DAC (Digital to Analog Converter) is proposed in this paper. The BIST method employs a ramp generator and two voltage references to test static parameters of a DAC: offset error, gain error, INL (Integral Non-Linearity) and DNL (Differential Non-Linearity). The optimization of calculating static parameters and the components sharing can reduce the BIST circuitry. The simulation result shows that the method is able to detect the static errors with the simple BIST structure.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mengzhang Cheng "A new test method for digital-to-analog converter", Proc. SPIE 12615, International Conference on Signal Processing and Communication Technology (SPCT 2022), 126151U (6 April 2023); https://doi.org/10.1117/12.2673944
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KEYWORDS
Analog to digital converters

Signal generators

Clocks

Error analysis

Switches

Analog electronics

Circuit switching

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